{"id":18,"date":"2015-06-11T10:59:00","date_gmt":"2015-06-11T10:59:00","guid":{"rendered":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/?page_id=18"},"modified":"2020-09-29T13:51:31","modified_gmt":"2020-09-29T13:51:31","slug":"publicaciones","status":"publish","type":"page","link":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/publicaciones","title":{"rendered":"Publications"},"content":{"rendered":"<ul>\n<li>\u00ab<a href=\"https:\/\/ieeexplore.ieee.org\/document\/9036906\">An Analytical Scalable Lumped-Element Model for GaN on Si Inductors<\/a>\u00bb<br \/>\nM. S. M. Montesdeoca, S. M. Angulo, D. M. Duarte, J. del Pino, J. Garc\u00eda and S. L. Khemchandani<br \/>\nIEEE Access, vol. 8, pp. 52863-52871, 2020, doi: 10.1109\/ACCESS.2020.2980926<\/li>\n<li>\u00ab<a href=\"https:\/\/www.mdpi.com\/2079-9292\/7\/10\/210\/htm\">DC Gate Leakage Current Model Accounting for Trapping Effects in AlGaN\/GaN HEMTs<\/a>\u00bb<br \/>\nR. Rodr\u00edguez; B. Gonz\u00e1lez; J. Garc\u00eda; G. Toulon; F. Morancho A. N\u00fa\u00f1ez<br \/>\n<span class=\"pv-accomplishment-entity__publisher\">Electronics MDPI<\/span>. A\u00f1o 2018 <a href=\"https:\/\/doi.org\/10.3390\/electronics7100210\">https:\/\/doi.org\/10.3390\/electronics7100210<\/a><\/li>\n<li>\u00ab<a href=\"http:\/\/www.sciencedirect.com\/science\/article\/pii\/S0038110117301612?via%3Dihub\">Electrothermal DC characterization of GaN on Si MOS-HEMTs<\/a>\u00bb<br \/>\nR. Rodr\u00edguez; B. Gonz\u00e1lez; J. Garc\u00eda; A. N\u00fa\u00f1ez<br \/>\nSolid-State Electronics. Elsevier. A\u00f1o 2017 <a href=\"https:\/\/doi.org\/10.1016\/j.sse.2017.08.002\">https:\/\/doi.org\/10.1016\/j.sse.2017.08.002<\/a><\/li>\n<li>&nbsp;\u00ab<a href=\"https:\/\/www.hindawi.com\/journals\/acmp\/2016\/8017139\/\">Large-Signal DG-MOSFET Modelling for RFID Rectification<\/a>\u00bb<br \/>\nR. Rodr\u00edguez; B. Gonz\u00e1lez; J. Garc\u00eda; A. L\u00e1zaro; B. I\u00f1iguez; A. Hern\u00e1ndez<br \/>\nAdvances in Condensed Matter Physics. 2016, Hindawi Publishing Corporation, Volume 2016 (2016), Article ID 8017139 <a href=\"http:\/\/dx.doi.org\/10.1155\/2016\/8017139\">http:\/\/dx.doi.org\/10.1155\/2016\/8017139<\/a><\/li>\n<\/ul>\n<li style=\"list-style-type: none;\">\n<ul>\n<li>\u201c<a href=\"http:\/\/www.sciencedirect.com\/science\/article\/pii\/S0038110114002500\" target=\"_blank\" rel=\"noopener noreferrer\">N-well resistance modelling in Q-factor of doughnut-shaped PN varactors<\/a>\u201d<br \/>\nM. Marrero-Mart\u00edn; B. Gonz\u00e1lez, J. Garc\u00eda, and A. Hern\u00e1ndez.<br \/>\nSolid-State Electronics. Elsevier. 103, pp.104-109. A\u00f1o 2015<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><a href=\"http:\/\/onlinelibrary.wiley.com\/doi\/10.1002\/pssa.201431897\/abstract\" target=\"_blank\" rel=\"noopener noreferrer\">Numerical simulation and compact modelling of AlGaN\/GaN HEMTs with mitigation of self\u2010heating effects by substrate materials<\/a>.<br \/>\nRodr\u00edguez, R., Gonz\u00e1lez, B., Garc\u00eda, J., Yigletu, F. M., Tirado, J. M., I\u00f1iguez, B., &amp; Nunez, A<br \/>\nphysica status solidi (a), 212(5), 1130-1136. 2015<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li>\u00ab<a href=\"http:\/\/www.tandfonline.com\/doi\/abs\/10.1080\/00207217.2011.651699\" target=\"_blank\" rel=\"noopener noreferrer\">Wide range fully integrated VCO with new cells-based varactor<\/a>\u00bb<br \/>\nM. Marrero; B. Gonz\u00e1lez; J. Garc\u00eda; S. L. Khemchandani; A. Hern\u00e1ndez; J. del Pino<br \/>\nInternational Journal of Electronics. 99 &#8211; 8, pp. 1165 &#8211; 1178. Reino Unido 2012.<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em>\u201c<a href=\"http:\/\/www3.interscience.wiley.com\/cgi-bin\/fulltext\/123239246\/PDFSTART\">Capacitive model for integrated PN varactors of cells with N<sup>+<\/sup> buried layer<\/a>\u201d<br \/>\n<\/em> M. Marrero-Mart\u00edn, J. Garc\u00eda, B. Gonz\u00e1lez and A. Hern\u00e1ndez<br \/>\nInternational Journal of Numerical Modelling: Electronic Networks, Devices and Fields, vol. 23, pp. 367-378, 2010 Published online in Wiley InterScience (www.interscience.wiley.com). DOI: 10.1002\/jnm.751<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em>\u201cCaracterizaci\u00f3n el\u00e9ctrica de transistores basados en nitruros\u201d<br \/>\n<\/em>Benito Gonz\u00e1lez P\u00e9rez, Francisco G\u00e1miz P\u00e9rez, Jos\u00e9 Mar\u00eda Tirado Mart\u00edn y Javier Garc\u00eda Garc\u00eda<br \/>\nVector Plus, vol. 29, pp. 31-39, 2007<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em>\u201c<a href=\"http:\/\/ieeexplore.ieee.org\/xpl\/abstractAuthors.jsp?arnumber=1642424\">Reliability Verification in a Measurement System of Integrated Varactors for RF Applications<\/a><strong>\u201d<\/strong><\/em><br \/>\nI. Gutierrez, J. Melendez, J. Garcia, I. Adin, G. Bistue, J. De No.<br \/>\nLatin America Transactions, IEEE (Revista IEEE America Latina) Vol. 3, Issue 4, pp: 15-20 Oct. 2005<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em>\u201c<\/em><em>Inductores integrados planos sobre tecnolog\u00edas de Silicio<\/em><em>\u201d<br \/>\n<\/em> J. del Pino, J. R. Sendra, A. Hern\u00e1ndez, B. Gonz\u00e1lez, J. Garc\u00eda, S. L. Khemchandani, and A. Hernandez<br \/>\nVector Plus, vol. 24, pp. 14-23, 2004<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em>\u00ab<a href=\"http:\/\/iopscience.iop.org\/0268-1242\/19\/5\/015\">Characterization of extrinsic resistances in temperature behaviour modelling of InGaAs MODFET\u2019s<\/a>\u00ab<\/em><br \/>\nB Gonz\u00e1lez, A Hern\u00e1ndez, J Garc\u00eda, J del Pino, J R Sendra and A Nunez<br \/>\nSemiconductor Science and Technology, Volumen: 19, pp. 648-654, 2004<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em>\u201cIntegrated Inductors Modeling for Library Development and Layout Generation\u201d<\/em><br \/>\nJ. del Pino, J. R. Sendra, A. Hern\u00e1ndez, B. Gonz\u00e1lez, J. Garc\u00eda, A. Garc\u00eda-Alonso and A. N\u00fa\u00f1ez,<br \/>\nInternational Journal of Analog Integrated Circuits and Signal Processing vol. 35, pp. 121-132. Kluwer Academic Publishers 2003<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em>\u201cModels and Tools for CMOS Integrated Inductors\u201d<\/em><br \/>\nJ. del Pino, J. R. Sendra, A. Hern\u00e1ndez, S. L. Khemchandani, J. Aguilera, B. Gonz\u00e1lez, J. Garc\u00eda and A. Nunez,<br \/>\nInternational Journal of Analog Integrated Circuits and Signal Processing vol. 33, pp. 171-178. Kluwer Academic Publishers 2002<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em>\u201c<\/em><em>Inductores integrados planos sobre tecnolog\u00edas de Silicio<\/em><em>\u201d<br \/>\n<\/em> B. Gonz\u00e1lez, J. Garc\u00eda, A. Hern\u00e1ndez, J. del Pino, and J. R. Sendra,<br \/>\nVector Plus, vol. 19, pp. 14-23, 2002<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em><a href=\"http:\/\/ieeexplore.ieee.org\/iel5\/2220\/21080\/00977526.pdf?tp=&amp;arnumber=977526&amp;isnumber=21080\">\u00abPower model for DCFL family\u00bb <\/a><\/em><br \/>\nJ. Garc\u00eda, A. Hern\u00e1ndez, J. del Pino, J. R. Sendra, B. Gonz\u00e1lez, and A. Nunez,<br \/>\nIEE Electronics Letters. Volumen 38, pp. 13-14, 2002<\/li>\n<\/ul>\n<\/li>\n<li style=\"list-style-type: none;\">\n<ul>\n<li><em>\u00abOptimization of the d-doped layer in P-HFETs at medium\/high temperatures\u00bb<\/em><br \/>\nB. Gonz\u00e1lez, A. Hern\u00e1ndez, J. Garc\u00eda, J. del Pino, J. R. Sendra and A. Nunez<br \/>\nSemiconductors Science and Technology. Volumen: 15, pp. 19- 23, 2000<\/li>\n<\/ul>\n<\/li>\n","protected":false},"excerpt":{"rendered":"<p>\u00abAn Analytical Scalable Lumped-Element Model for GaN on Si Inductors\u00bb M. S. M. Montesdeoca, S. M. Angulo, D. M. Duarte, J. del Pino, J. Garc\u00eda and S. L. Khemchandani IEEE Access, vol. 8, pp. 52863-52871, 2020, doi: 10.1109\/ACCESS.2020.2980926 \u00abDC Gate Leakage Current Model Accounting for Trapping Effects in AlGaN\/GaN HEMTs\u00bb R. Rodr\u00edguez; B. Gonz\u00e1lez; J. [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-18","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/wp-json\/wp\/v2\/pages\/18","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/wp-json\/wp\/v2\/comments?post=18"}],"version-history":[{"count":15,"href":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/wp-json\/wp\/v2\/pages\/18\/revisions"}],"predecessor-version":[{"id":172,"href":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/wp-json\/wp\/v2\/pages\/18\/revisions\/172"}],"wp:attachment":[{"href":"https:\/\/www.iuma.ulpgc.es\/jgarcia\/wp-json\/wp\/v2\/media?parent=18"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}